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Holger Vogt
e5c162f126
dc sweep fails after transient sim:
keep MODEDCTRANCURVE as provided by commit
7d8236766 ("b3ld.c, b4ld.c, b3v32ld.c: enable capacitance calculation during dc sweep", 2012-10-03)
Instead exclude current integration when MODEDCTRANCURVE is selected.
Unify setting ChargeComputationNeeded in b4vdld.c,
make it as in other b4xxld.c.
4 years ago
..
func
inp_do_macro_param_replace(), fix several bugs concerning .func processing
12 years ago
lib-processing
Modified regression tests for library processing to make indication of failures more robust
6 years ago
misc
No more printout of 'Initial Transient Solution'
6 years ago
model
spicelib/parser, support instance parameter defaults on .model lines
8 years ago
parser
regression/**/*.cir, hide printed numeric values in some test cases
9 years ago
pipe
add alter-1.cir to EXTRA_DIST
8 years ago
pz
tests/regression/pz/ac-resistance.cir, check ac resistance (op, ac and pz)
11 years ago
sens
tests/regression/sens, fix test cases
9 years ago
subckt-processing
missing file in commit "b14eb0a4 * regression test for multiple .global cards"
12 years ago
temper
upgrade regression test to the previous commit
10 years ago
Makefile.am
regression test for device.c "alter"
8 years ago